Keithley Invitation

European Keithley City Seminar Tour 2009

Belgium / France / Germany / Italy /
Netherlands / Sweden / Switzerland / UK

INVITATION
to Keithley´s live technical seminars
in 22 cities across Europe

Test & Measurement Innovations for Wireless/RF, Nanotechnology, and Electronic Systems Applications

– The seminars are free of charge –

BASIC INFORMATION

Scroll down and click on the links for your territory to see detailed local seminar information and to register.

The practical lectures are aimed at all decision-makers and engineers who are involved with electrical testing and measuring systems in the fields of research, development, production, quality control, automation, test stand design, data acquisition, and automatic control.

The seminars are given by our Marketing specialists from the Keithley Headquarters in Cleveland, USA, and/or by our experienced application engineers. They will be available during and after the events to answer and discuss your questions and issues.

THE TOPICS

The following contents are covered dependent upon the event venue (see links below):

Topic #1: Demystifying Testing of MIMO Communication Systems
- Multiple Input/Multiple Output (MIMO) as foundation of expanding 3G and next generation 4G technologies
- Review HSPA+, Long-term evolution (LTE), IEEE 802.16m, LTE Advanced
- Testing examples, incl. spatial multiplexing, adaptive antenna processing, beam forming
- MIMO product demonstration
Topic #2: T&M products overview for Wireless/RF from 2G to 4G
- Overview of T&M requirements & challenges, incl. WiMAX, LTE
- Vector Signal Analyzer, Vector Signal Generator product overview
- SIGNALMEISTER signal generation/analyzing und simulation software
- VSA 2820, VSG 2920 with SIGNALMEISTER product demonstration and hands-on
Topic #3: The electrical characterization of Photovoltaic 'PV' (Solar) Cells
- Overview of different solar cells, incl. crystalline silicon (SI), thin-film (amorphous Si, CdTE), polymer organic
- Electrical characterization of PV solar cells using current/voltage source & sink instruments
- Measuring key PV cell parameters, incl. maximum power, fill-factor (FF), conversion efficiency, doping density
- SourceMeter 2600A, 4200-SCS product demonstration
Topic #4: T&M product overview for Nano/Semiconductor, Component, Electronic Systems
- Overview of typical T&M requirements: From nano to electronic systems
- SourceMeter 2600A and precision DC/pulse sourcing and measuring
- Switch/DMM 3706 for high density switching and measuring
- TSPEXPRESS, LXI and system integration
- 4200-SCS, 4200-PIV, 4200-CVU with high functionality DC/CV/pulse sourcing and measuring
- ACS, ACSBASICEDITION and system integration
- General purpose T&M instrumentation round-up, incl. consultancy/training services

DATES, EVENT VENUES & TOPICS:

The seminars are held between April 23 and May 21, 2009 in 22 cities in Belgium, France, Germany, Italy, The Netherlands, Sweden, Switzerland, and the UK. See details on your local seminars and registration forms under "Registration" below.

Attendance is free of charge. Presentations are held in English or in local language.

Registration is required for each participant (please use the links below to see your local seminars for details and for registration).

REGISTRATION

Please click on your country for full seminar details and to register and to reserve your seat:

Belgium	click here
France	click here
Germany	click here
Italy	click here
Netherlands	click here
Sweden	click here
Switzerland	click here
UK	click here

Attendance at the seminar is free of charge. Registration is required for each participant.

The number of participants is limited. Please register early if you definitely want to attend. We will then reserve a place for you and you will receive confirmation of your reservation by e-mail.

Please pass on this invitation to interested colleagues (separate registration required)!

Attendance is free of charge!

We look forward to seeing you!