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Seminar Content
This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
After attending this seminar, you will understand:
- What is C-V testing?
- What types of devices can C-V testing be used to characterize?
- Who can use C-V?
- C-V measurement challenges
Register below!
About the Presenter:
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
Target audience:
This seminar is recommended for engineers new to semiconductor materials and device testing, process and device engineers who would like to refresh their knowledge of this testing methodology, and characterization lab managers.
This informative 45-minute seminar is followed by an interactive Q&A (during live broadcast only) where you can ask the presenter for additional insight on this important topic.
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