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Seminar Content
This seminar is designed to cover the the basics of low current (from nA to fA) electrical measurements, including how to select the right current measurement instrument, practical ways to reduce current noise in measurement setups, and how to quantify subtle sources of noise. These measurement best practices are important for applications in semiconductor material/device characterization, nanoscience test and measurement, optoelectronic device characterization, and many more. Application examples where such sensitive measurements are required will be discussed, together with a discussion of recent innovative test equipment solutions.
After attending this seminar, you will understand:
- Measurement techniques required for measuring very small currents.
- Sources of measurement error that will affect such low current measurements.
- Measurement solutions that can be used in low current measurement applications.
Register below!
About the Presenter:
Jonathan Tucker is the Lead Marketing Engineer of Nanotechnology, Research and Education, and the Sensitive Measurements Product Line Manager at the Keithley Instrument´s headquarter in Cleveland, Ohio, USA. His current focus is business strategy and product development of electrical characterization and measurement tools for nanotechnology applications. He holds a Bachelors of Electrical Engineering degree from Cleveland State University and an MBA from Kent State University.
Target audience:
This informative 45-minute seminar is recommended for students, as well as for professional researchers, engineers, and scientists in areas such as materials science, chemistry, nanoscience, and semiconductor device development who wish to get a better understanding of low current electrical measurements.
It is accompagnied by an interactive Q&A (during live broadcast only) where you can ask the presenter for additional insight on this important topic.
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