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Seminar Content
This seminar will show the best practices for on-wafer probing and how to identify and solve common problems.
When you are performing on-wafer measurements using semi-automatic probers you will learn how to achieve accurate measurements and avoid problems with the interconnect between the test equipment and the prober.
The one hour webinar will cover the following topics:
- How to cable for accurate low current DC measurements
- How to cable for accurate CV measurements
- How to cable for ultra fast and pulse IV measurements
- The benefits of using Keithley-supplied cables and accessories to perform DC, ultra fast, CV, and pulsed IV measurements
- Proper grounding and guarding techniques
- Selecting the proper types of interconnect cables
- How to troubleshoot interconnect problems
Register below!
About the Presenter:
Dave Rose is a senior staff applications engineer at Keithley Instruments, Inc. in Cleveland, Ohio. Dave joined Keithley in 1987 and has spent roughly half of his career in design engineering and the other half in applications engineering.
Target audience:
This informative one hour web seminar is recommended for test engineers and test engineering managers who have a basic understanding of wafer probing. The content is appropriate for engineers working with on-wafer devices.
It is accompagnied by an interactive Q&A (during live broadcast only) where you can ask the presenter for additional insight on this important topic.
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