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Seminar Content
Ultra-Fast Current-Voltage (I-V) testing, which includes pulsed I-V, transient I-V, and pulsed sourcing testing, is of increasing importance in the development of new semiconductor materials, processes, and devices. Attend our seminar and learn the fundamentals of Ultra-Fast I-V characterization.
This on-line seminar explores the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.
Fundamentals of Ultra-Fast I-V Device Characterization will cover a core description of the measurement hardware and setups, including cabling to a probe station. It will also discuss how its used, typical test setups, and common error sources. Finally, some practical examples of device measurements will be given.
Register today!
About the Presenter:
Lee Stauffer is Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group, based in Cleveland, Ohio. Prior to joining Keithley, his career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.
Target audience:
This informative 1-hour web seminar is recommended for
- Students, researchers, and engineers doing characterization of materials, processes, and devices
- Lab managers wanting to learn about this useful measurement technique
- Engineers doing device and material reliability studies (WLR, ESD, latchup, etc.)
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